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current | 12:01, 10 April 2011 | 607 × 431 (11 KB) | Enaswiki | {{Information |Description ={{en|1={{Information |Description ={{en|1=Schematic infrared transmission microscopy setup for wafer bond characterization.}} |Source ={{own}} |Author =Fraunhofer ENAS, [[User:neum.dan|D. |
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