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| Description |
English: Schematic infrared transmission microscopy setup for wafer bond characterization. |
| Source | Own work |
| Author | Fraunhofer ENAS, D. Neumann |
| Permission (Reusing this file) |
   This file is licensed under the Creative Commons Attribution-Share Alike 3.0 Germany license. Attribution: Fraunhofer ENAS
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 12:00, 10 April 2011 | | 523 × 366 (12 KB) | Enaswiki | {{Information |Description ={{en|1=Schematic infrared transmission microscopy setup for wafer bond characterization.}} |Source ={{own}} |Author =Enaswiki |Date = |Permission ={{cc-by-sa-3.0-de|Fraunhofer |
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