File:Popcorn noise graph.png

Graph of burst noise.

From Noise Sources in Bulk CMOS, Kent H. Lundberg, who originally got it from 1/f noise in MOSFETs with ultrathin gate dielectrics, Gross, B.J. Sodini, C.G. 10.1109/IEDM.1992.307497 Copyright held by the publisher or the artist. Claimed as fair use regardless.

Burst noise

One image from a paper

No

Demonstrates the waveform of real-life burst noise

I can't find a free equivalent. I don't believe it's easy to create one.

A graph of burst noise or "popcorn noise".

Caption from Lundberg:

Figure 3: Typical popcorn noise, showing discrete levels of channel current modulation due to the trapping and release of a single carrier, for three different bias conditions

From original caption:

Figure 1. Typical random-telegraph noise signal.

Top Trace: V_gs = 1.4 V.

Middle Trace: V_gs = 1.6 V.

Bottom Trace: V_gs = 1.8 V.

V_ds = 0.2 V for all traces.

Description:

A measurement system similar to that used in [M. Kirton and M. Uren, Adv. Phys., vol. 38, no. 4, p. 368, 1989.] was used to characterize the deep-submicron devices. Following amplification by a low-noise transresistance amplifier with a gain of 10⁶, the drain current signal is input to an HP3561 Dynamic Signal Analyzer which performs a time capture. The mean capture time <τ_c> and the mean emission time <τ_e> are extracted from the RTS signal-vs-time data capture using a HP200 series computer. An MMR LTMP-4 low temperature microprobe was used to characterize devices across a range of temperatures. The LTMP has an operating temperature range of 80-400 K.