Silicon_dislocation_orientation_111_mag_500x.png (768 × 576 pixels, file size: 650 KB, MIME type: image/png)
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Date/Time | Thumbnail | Dimensions | User | Comment | |
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current | 00:15, 13 September 2005 | ![]() | 768 × 576 (650 KB) | Twisp | * Title: Dislocations in Si crystal, orientation 111 * Desc: Image of dislocations in Si crystal made using interference microscope with 500x magnification. Crystal orientation can be determined by the triangular (pyramidal) shape of dislocations. * Autho |
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