Talk:Flatness (manufacturing)
Latest comment: 1 month ago by Ldm1954 in topic Material merged from Whitworth's three plates method
 | Whitworth's three plates method was nominated for deletion. The discussion was closed on 27 September 2024 with a consensus to merge. Its contents were merged into Flatness (manufacturing). The original page is now a redirect to this page. For the contribution history and old versions of the redirected article, please see its history; for its talk page, see here. |
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Geometric Dimensioning and Tolerancing
editThis article needs to reference "flatness" as used in Geometric Dimensioning and Tolerancing.
F3meyer (talk) 16:53, 13 June 2011 (UTC)
- You're right. This is very important as GD&T is the only thing that provides an operational definition once you get down on the microscopic scale (AFAIK). I added a basic mention of GD&T to the article. But of course the details will need to be filled in over time as anyone is able. — ¾-10 00:29, 14 June 2011 (UTC)
Semiconductor Manufacturing Flatness
editThe article needs to reference the different definitions of flatness used in semiconductor manufacturing, their measurement, and relation to one another.
Material merged from Whitworth's three plates method
editCopied material from Whitworth's three plates method, edits mainly from the page originator User:Amomchilov, see the talk page of that redirect for full credit information. There was an AfD discussion for that page, which concluded with a merge/redirect result. Please note that some further editing may be appropriate. Ldm1954 (talk) 17:07, 27 September 2024 (UTC)