User:FuzzyMagma/X-ray Laue Diffraction Microscopy

X-ray Laue diffraction microscopy is a technique that examines the structure of materials with sub-micron spatial resolution in all three dimensions.[1] It is a type of X-ray diffraction that uses polychromatic, rather than monochromatic synchrotron X-rays, to produce a regular array of spots on a photographic emulsion resulting from X-rays scattered by certain groups of parallel atomic planes within a crystal.[2] The Laue diffraction microscopy technique uses white Bremsstrahlung radiation to determine the crystallographic orientation of single crystalline materials.[3] In addition, the technique can be used to examine detailed local structural information of crystalline materials, such as crystallographic orientation, orientation gradients, and strain.[4] X-ray Laue diffraction microscopy has also been applied to protein crystals, allowing for time-resolved crystallography and the generation of the protein structure in timescales of about 1 second.[5]

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Introduction

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X-ray Laue diffraction microscopy has a rich history, beginning with Max von Laue's discovery of the diffraction of X-rays by crystals in 1912 [5].[8] Laue's discovery was quickly followed up by William Henry Bragg, who reinterpreted the diffraction phenomenon in terms of X-ray reflection by the planes of the crystal, and his son William Lawrence, who developed the theory of X-ray diffraction and demonstrated its application for the study of crystal structures and precise determination of X-ray wavelengths [2].[9]

Laue diffraction occurs when a thin, pencil-like beam of X-rays is allowed to impinge on a crystal, and those of certain wavelengths are oriented at just the proper angle to a group of atomic planes, producing a regular array of spots on a photographic emulsion [3]. X-ray Laue diffraction has been applied to protein crystals in a limited number of studies over several decades, allowing time-resolved crystallography and generation of protein structure in timescales of about 1 second [4].

In recent years, X-ray Laue diffraction microscopy has seen significant advances, with the technique being used to examine the structure of materials with sub-micron spatial resolution in all three dimensions.[6] The science area of X-ray microscopy has also seen rapid development, with the discovery of X-rays by Wilhelm Conrad Röntgen in 1895, and the subsequent use of X-ray diffraction to probe the atomic scale.[10]

Principles and Instrumentation

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Applications

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Limiations and future directions

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References

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  1. ^ "X-ray Laue Diffraction Microscopy in 3D at 34-ID-E, APS". Advanced Photon Source. Retrieved 2023-04-05.
  2. ^ "Laue diffraction | Definition & Facts | Britannica". www.britannica.com. Retrieved 2023-04-05.
  3. ^ Welzmiller, Simon (2021-03-04). "Single Crystal X-Ray Diffraction of Materials". Advancing Materials. Retrieved 2023-04-05.
  4. ^ Liu, W.; Zschack, P.; Tischler, J.; Ice, G.; Larson, B. (2011-09-09). "X‐ray Laue Diffraction Microscopy in 3D at the Advanced Photon Source". AIP Conference Proceedings. 1365 (1): 108–111. Bibcode:2011AIPC.1365..108L. doi:10.1063/1.3625316. ISSN 0094-243X.
  5. ^ "X-Ray Laue Diffraction - an overview". ScienceDirect Topics. Retrieved 2023-04-05.
  6. ^ a b "X-ray Laue Diffraction Microscopy in 3D at 34-ID-E, APS". Advanced Photon Source. Retrieved 2023-04-05.
  7. ^ Moffat, Keith (2019-06-17). "Laue diffraction and time-resolved crystallography: a personal history". Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences. 377 (2147): 20180243. Bibcode:2019RSPTA.37780243M. doi:10.1098/rsta.2018.0243. ISSN 1364-503X. PMC 6501890. PMID 31030647.
  8. ^ "The Nobel Prize in Physics 1914". NobelPrize.org. Retrieved 2023-04-05.
  9. ^ Robotti, Nadia (2013-02-01). "The discovery of X-ray diffraction". Rendiconti Lincei. 24 (1): 7–18. doi:10.1007/s12210-012-0205-1. ISSN 1720-0776. S2CID 122365170.
  10. ^ Robotti, Nadia (2013-02-01). "The discovery of X-ray diffraction". Rendiconti Lincei. 24 (1): 7–18. doi:10.1007/s12210-012-0205-1. ISSN 1720-0776. S2CID 122365170.